Determination of Trapping Parameters in N-Ga4se3s by Thermally Stimulated Current Measurements
| dc.authorid | Goksen, Kadir/0000-0001-8790-582X | |
| dc.authorscopusid | 7801499255 | |
| dc.authorscopusid | 35580905900 | |
| dc.authorwosid | Goksen, Kadir/Kfq-6322-2024 | |
| dc.authorwosid | Gasanly, Nizami/Hre-1447-2023 | |
| dc.contributor.author | Goksen, K. | |
| dc.contributor.author | Gasanly, N. M. | |
| dc.date.accessioned | 2025-05-10T17:26:57Z | |
| dc.date.available | 2025-05-10T17:26:57Z | |
| dc.date.issued | 2009 | |
| dc.department | T.C. Van Yüzüncü Yıl Üniversitesi | en_US |
| dc.department-temp | [Goksen, K.] Yuzuncu Yil Univ, Dept Phys, TR-65080 Van, Turkey; [Gasanly, N. M.] Middle E Tech Univ, Dept Phys, TR-06531 Ankara, Turkey | en_US |
| dc.description | Goksen, Kadir/0000-0001-8790-582X | en_US |
| dc.description.abstract | Thermally stimulated current (TSC) measurements were carried out on as-grown n-Ga4Se3S layered crystals in the temperature range 10-300 K. The experimental data were analysed by using different heating rates, initial rise, curve fitting and isothermal decay methods. The results of the analysis showed good agreement with each other. The measurements revealed the presence of one trapping level with activation energy of 23 meV. The corresponding capture cross-section and concentration of traps were found to be 2.2 10-23 cm2 and 2.9 1011 cm-3, respectively. TSC experiments showed the presence of an exponential distribution of electron-trapping states in Ga4Se3S crystal. The variation of one order of magnitude in the trap density for every 34 meV was obtained. | en_US |
| dc.description.woscitationindex | Science Citation Index Expanded | |
| dc.identifier.doi | 10.1080/14786430802660423 | |
| dc.identifier.endpage | 447 | en_US |
| dc.identifier.issn | 1478-6435 | |
| dc.identifier.issn | 1478-6443 | |
| dc.identifier.issue | 5 | en_US |
| dc.identifier.scopus | 2-s2.0-61449103639 | |
| dc.identifier.scopusquality | Q3 | |
| dc.identifier.startpage | 435 | en_US |
| dc.identifier.uri | https://doi.org/10.1080/14786430802660423 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14720/11818 | |
| dc.identifier.volume | 89 | en_US |
| dc.identifier.wos | WOS:000263365900003 | |
| dc.identifier.wosquality | Q3 | |
| dc.language.iso | en | en_US |
| dc.publisher | Taylor & Francis Ltd | en_US |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | Semiconductors | en_US |
| dc.subject | Layered Crystals | en_US |
| dc.subject | Defects | en_US |
| dc.subject | Electrical Properties | en_US |
| dc.subject | Thermally Stimulated Current | en_US |
| dc.title | Determination of Trapping Parameters in N-Ga4se3s by Thermally Stimulated Current Measurements | en_US |
| dc.type | Article | en_US |