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Metal/Semiconductor Contact Properties of Al/Co(ii)complex Compounds

dc.authorid Gulcan, Mehmet/0000-0002-3921-8811
dc.authorid Goksen, Kadir/0000-0001-8790-582X
dc.authorscopusid 6602421311
dc.authorscopusid 8226754300
dc.authorscopusid 7801499255
dc.authorscopusid 35732479200
dc.authorwosid Sönmez, Mehmet/V-5046-2018
dc.authorwosid Gülcan, Mehmet/Aat-1504-2021
dc.authorwosid Goksen, Kadir/Kfq-6322-2024
dc.contributor.author Temirci, Cabir
dc.contributor.author Gulcan, Mehmet
dc.contributor.author Goksen, Kadir
dc.contributor.author Sonmez, Mehmet
dc.date.accessioned 2025-05-10T16:49:01Z
dc.date.available 2025-05-10T16:49:01Z
dc.date.issued 2011
dc.department T.C. Van Yüzüncü Yıl Üniversitesi en_US
dc.department-temp [Temirci, Cabir; Goksen, Kadir] Yuzuncu Yil Univ, Dept Phys, Fac Sci & Arts, TR-65080 Van, Turkey; [Gulcan, Mehmet] Yuzuncu Yil Univ, Dept Chem, Fac Sci & Arts, TR-65080 Van, Turkey; [Sonmez, Mehmet] Gaziantep Univ, Dept Chem, Fac Sci & Arts, TR-27310 Gaziantep, Turkey en_US
dc.description Gulcan, Mehmet/0000-0002-3921-8811; Goksen, Kadir/0000-0001-8790-582X en_US
dc.description.abstract A ligand(N-APTH) and Co(II)complex compound of bidentate ligand which contains a ring of the pyrimidine have been produced. For the optical transmission measurements of the Co(II)complex compound thin films, a UV-Visible (UV-Vis) spectrophotometer was employed. As a result of optical measurements. it was revealed that Co(II)complex compound tends to show a semiconductor characteristic with the bandgap value of 3.46 eV. An attempt has been made to explore the rectifying and ohmic properties of Al/Co(II)complex compound/Cu structures assuming that Co(II)complex compound may exhibit a rectifier or ohmic behavior, depending on the fabrication process, when brought into an appropriate contact with a metal. From current-voltage (I-V) measurements, it was found that the device could show good ohmic and rectifying properties intentionally depending on the experimental process followed during fabrication. (C) 2010 Published by Elsevier B.V. en_US
dc.description.sponsorship Yuzuncu Yil University Scientific Research Management Office (BAPB) en_US
dc.description.sponsorship The authors would like to thank Yuzuncu Yil University Scientific Research Management Office (BAPB) for their support. en_US
dc.description.woscitationindex Science Citation Index Expanded
dc.identifier.doi 10.1016/j.mee.2010.08.017
dc.identifier.endpage 45 en_US
dc.identifier.issn 0167-9317
dc.identifier.issn 1873-5568
dc.identifier.issue 1 en_US
dc.identifier.scopus 2-s2.0-78049245291
dc.identifier.scopusquality Q2
dc.identifier.startpage 41 en_US
dc.identifier.uri https://doi.org/10.1016/j.mee.2010.08.017
dc.identifier.uri https://hdl.handle.net/20.500.14720/1712
dc.identifier.volume 88 en_US
dc.identifier.wos WOS:000285285000009
dc.identifier.wosquality Q3
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Schottky Barrier, Rectification en_US
dc.subject Thermionic Emission en_US
dc.subject Organic Compounds en_US
dc.title Metal/Semiconductor Contact Properties of Al/Co(ii)complex Compounds en_US
dc.type Article en_US

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