The Effect of The Chemical Environment on The K-beta/K-alpha X-Ray Ratio
dc.authorscopusid | 6701569189 | |
dc.authorscopusid | 58530092200 | |
dc.authorscopusid | 7003852690 | |
dc.contributor.author | KUCUKONDER, A | |
dc.contributor.author | Şahin, Y | |
dc.contributor.author | Büyükkasap, E | |
dc.date.accessioned | 2025-05-10T17:13:16Z | |
dc.date.available | 2025-05-10T17:13:16Z | |
dc.date.issued | 1993 | |
dc.department | T.C. Van Yüzüncü Yıl Üniversitesi | en_US |
dc.department-temp | Ataturk Univ,Fac Arts & Sci,Dept Phys,25240 Erzurum,Turkey; Ataturk Univ,Fac Educ,Dept Phys,25240 Erzurum,Turkey | en_US |
dc.description.abstract | Chemical effects on the Kbeta/Kalpha X-ray intensity ratios were investigated for different constitutions of Ti, V, Fe, Se, Br, Zr and Ce by a Ge(Li) X-ray detector. The vacancies were produced by heavily filtered Am-241 gamma-rays. It is found that the Kbeta/Kalpha X-ray intensity ratios measured with compounds deviated up to 12% from the corresponding values of the pure elements (Ti, V, Fe) are larger than for the others (Se, Br, Zr and Ce). | en_US |
dc.description.woscitationindex | Science Citation Index Expanded | |
dc.identifier.doi | 10.1007/BF02463829 | |
dc.identifier.endpage | 1299 | en_US |
dc.identifier.issn | 0392-6737 | |
dc.identifier.issue | 10 | en_US |
dc.identifier.scopus | 2-s2.0-51249166877 | |
dc.identifier.scopusquality | N/A | |
dc.identifier.startpage | 1295 | en_US |
dc.identifier.uri | https://doi.org/10.1007/BF02463829 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14720/8116 | |
dc.identifier.volume | 15 | en_US |
dc.identifier.wos | WOS:A1993MN96500005 | |
dc.identifier.wosquality | N/A | |
dc.language.iso | en | en_US |
dc.publisher | Editrice Compositori Bologna | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.title | The Effect of The Chemical Environment on The K-beta/K-alpha X-Ray Ratio | en_US |
dc.type | Article | en_US |