Some Structural and Fluctuation Properties of Superconducting Ybco Thin Films
dc.authorscopusid | 56186362100 | |
dc.authorwosid | Demi̇rel, Ali/Aak-5802-2021 | |
dc.contributor.author | Demirel, AI | |
dc.date.accessioned | 2025-05-10T17:15:28Z | |
dc.date.available | 2025-05-10T17:15:28Z | |
dc.date.issued | 2001 | |
dc.department | T.C. Van Yüzüncü Yıl Üniversitesi | en_US |
dc.department-temp | Yusuncu Yil Univ, Fac Sci & Arts, Van, Turkey | en_US |
dc.description.abstract | The characterization of superconducting thin films was performed by starting with x-ray measurements as this is a necessary technique to single out potential superconductors although it is not sufficient to determine superconductivity. The temperature dependence of the paraconductivity can be described by a power law described by the Aslamasov-Larkin theory. A study of the fluctuation conductivity was performed leading to the determination of the coherence length. The values found are compatible with the two-dimensional nature of these new superconductors. | en_US |
dc.description.woscitationindex | Science Citation Index Expanded | |
dc.identifier.doi | 10.1088/0953-2048/14/11/315 | |
dc.identifier.endpage | 980 | en_US |
dc.identifier.issn | 0953-2048 | |
dc.identifier.issue | 11 | en_US |
dc.identifier.scopus | 2-s2.0-0035507579 | |
dc.identifier.scopusquality | Q2 | |
dc.identifier.startpage | 978 | en_US |
dc.identifier.uri | https://doi.org/10.1088/0953-2048/14/11/315 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14720/8628 | |
dc.identifier.volume | 14 | en_US |
dc.identifier.wos | WOS:000172638300016 | |
dc.identifier.wosquality | Q2 | |
dc.institutionauthor | Demirel, AI | |
dc.language.iso | en | en_US |
dc.publisher | Iop Publishing Ltd | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.title | Some Structural and Fluctuation Properties of Superconducting Ybco Thin Films | en_US |
dc.type | Article | en_US |