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Magnetic Relaxation and Flux Creep in Superconducting Ybco Thin Films

dc.authorscopusid 56186362100
dc.authorwosid Demi̇rel, Ali/Aak-5802-2021
dc.contributor.author Demirel, AI
dc.date.accessioned 2025-05-10T17:39:04Z
dc.date.available 2025-05-10T17:39:04Z
dc.date.issued 2003
dc.department T.C. Van Yüzüncü Yıl Üniversitesi en_US
dc.department-temp Yuzuncu Yil Univ, Fac Sci & Arts, TR-65080 Van, Turkey en_US
dc.description.abstract In this work, the temperature dependence of the magnetic relaxation in samples of YBa2Cu3O7 (YBCO) thin films of two different qualities grown on MgO by metal organic chemical deposition technique (MOCVD) is measured in the range of 4.2-80 K using an initial applied magnetic field of 0.1 T. The relaxation data are analyzed in terms of a single effective activation energy and then more correctly of a distribution of activation energies. The single activation energies extracted are in broad agreement with published results. en_US
dc.description.woscitationindex Science Citation Index Expanded
dc.identifier.doi 10.1142/S0217984903006104
dc.identifier.endpage 1080 en_US
dc.identifier.issn 0217-9849
dc.identifier.issn 1793-6640
dc.identifier.issue 20-21 en_US
dc.identifier.scopus 2-s2.0-0242666967
dc.identifier.scopusquality Q2
dc.identifier.startpage 1075 en_US
dc.identifier.uri https://doi.org/10.1142/S0217984903006104
dc.identifier.uri https://hdl.handle.net/20.500.14720/14785
dc.identifier.volume 17 en_US
dc.identifier.wos WOS:000186222100001
dc.identifier.wosquality Q2
dc.institutionauthor Demirel, AI
dc.language.iso en en_US
dc.publisher World Scientific Publ Co Pte Ltd en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Magnetization en_US
dc.subject Superconductor Ybco en_US
dc.subject Flux Creep en_US
dc.subject Magnetic Relaxation en_US
dc.subject Activation Energy en_US
dc.title Magnetic Relaxation and Flux Creep in Superconducting Ybco Thin Films en_US
dc.type Article en_US

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