Optimal Feature Selection for Distributed Bearing Fault Detection Using Cost-Effective, High-Performance Machine Learning Algorithms

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Date

2026

Journal Title

Journal ISSN

Volume Title

Publisher

IEEE-Inst Electrical Electronics Engineers inc

Abstract

This study presents a highly accurate and cost-efficient machine learning framework for diagnosing distributed bearing faults by identifying an optimal and compact set of frequency-domain features. The analysis is based on a comprehensive dataset collected from an experimental testbed comprising a coupled induction motor operating under 50 distinct combinations of speed and load. The dataset encompasses both healthy bearings and those exhibiting various distributed faults-such as lubrication degradation, contamination, electrical erosion, and flaking-as well as a localized fault in the form of a single-point defect on the outer race. Data were acquired using a multisensor module integrating three-axis vibration, stray magnetic flux, and two phase current signals. The primary objective is to reduce an initial set of 102 frequency-based features to a minimal subset suitable for deployment on resource-constrained microcontrollers without sacrificing classification performance. Employing Mutual Information (MI) and Random Forest (RF) techniques for feature selection, the study successfully identifies a critical subset of five features. A Random Forest classifier trained on these features achieved an impressive test accuracy of 99.58%. Furthermore, the combination of top-ranked features from both MI and RF methods led to improved classification performance over using either method independently, thereby enhancing the robustness and reliability of industrial bearing fault detection.

Description

Keywords

Fault Diagnosis, Lubrication, Feature Extraction, Erosion, Vibrations, Contamination, Fault Detection, Accuracy, Random Forests, Benchmark Testing, Distributed Bearing Faults Detection, Frequency-Based Feature Selection, Machine Learning, Multisensor Data

WoS Q

Q2

Scopus Q

N/A

Source

IEEE Journal of Emerging and Selected Topics in Industrial Electronics

Volume

7

Issue

1

Start Page

46

End Page

57