Ohmic and Rectifier Properties of Al/Ligand(n-apth) and Al/Cu(ii)complex Contacts

Abstract

We have produced a Ligand(N-APTH) and Cu(II)Complex of bidentate ligand containing a ring of the pyrimidine. Optical transmission measurements of the Ligand(N-APTH) and Cu(II)Complex thin films were performed by using a UV-Visible (UV-VIS) spectrophotometer. From the optical measurements, it was seen that the materials show semiconductor behaviors giving appropriate bandgaps with the values of 3.15 eV and 2.36 eV for Ligand(N-APTH) and Cu(II)Complex, respectively. With the pre-assumption that the material may exhibit a rectifier or ohmic behavior when it is brought into an appropriate contact with a metal, an attempt to explore the rectifying and ohmic properties of Al/Ligand(N-APTH)/Cu and All Cu(II)Complex/Cu contacts was made. As a result of current-voltage (I-V) measurements, it was discovered that the devices show excellent rectifier properties with a rectification ratio of about 10(-3) for All Ligand(N-APTH)/Cu and 10(-5) for Al/Cu(II)Complex/Cu rectifier contacts, respectively. (C) 2010 Elsevier B.V. All rights reserved.