Effect of Root Canal Disinfection With a Diode Laser on Postoperative Pain After Endodontic Retreatment

Abstract

Objective: The aim of this randomized clinical trial was to evaluate the influence of root canal disinfection with a 940-nm diode laser on the intensity of pain after endodontic retreatment. Background data: Microorganisms are the most common causes of tooth pain. Therefore, clinical studies are needed to explore the effect of disinfection techniques on postoperative pain. Methods: Eighty-four patients scheduled for endodontic retreatment were allocated to two groups in a 1:1 ratio (n = 42 each). After root canal filling removal and chemomechanical procedures, the root canals were disinfected with a 940-nm diode laser in one group [laser disinfection (LD) group]. In the other group, a mock application of laser was made with the power off [pseudo-laser disinfection (PLD) group]. All retreatment procedures were completed in a single visit. The patients assessed their pain levels at 24, 48, and 72 h after retreatment using a numeric rating scale. The number of analgesic pills used during this period was also recorded. The collected data were statistically analyzed using Mann-Whitney U and Wilcoxon tests. Results: Postoperative pain on the first 2 days was significantly lesser in the LD group than in the PLD group (p < 0.05), and the difference became insignificant on the third day (p > 0.05). Moreover, analgesic intake over 3 days and pain on percussion on the fourth day were significantly lesser in the LD group than in the PLD group (p < 0.05). Conclusions: Elimination of microorganisms from root canals is important for preventing postoperative complications. Our findings suggest that diode LD can reduce postoperative pain and provide comfort after endodontic retreatment. This study is registered in www.ClinicalTrials.gov database with the identifier number NCT03584880.